The optical characterization of organometallic complex thin films by spectroscopic ellipsometry and photovoltaic diode application

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dc.authoridOzaydin, Cihat/0000-0001-6690-0122
dc.authoridPakma, Osman/0000-0002-3098-0973
dc.authoridGullu, Omer/0000-0002-3785-6190
dc.contributor.authorOzaydin, C.
dc.contributor.authorGullu, O.
dc.contributor.authorPakma, O.
dc.contributor.authorIlhan, S.
dc.contributor.authorAkkilic, K.
dc.date.accessioned2024-12-24T19:27:29Z
dc.date.available2024-12-24T19:27:29Z
dc.date.issued2016
dc.departmentSiirt Üniversitesi
dc.description.abstractIn this work, organometallic complex (OMC) films have been deposited onto glass or silicon substrates by spin coating technique and their photovoltaic application potential has been investigated. Optical properties and thickness of the film have been investigated by spectroscopic ellipsometry (SE). Also, transmittance spectrum has been taken by UV/vis spectrophotometer. The optical method has been used to determine the band gap value of the films. Also, Au/OMC/n-Si metal/interlayer/semiconductor (MIS) diode has been fabricated. Current voltage and photovoltaic properties of the structure were investigated. The ideality factor (n) and barrier height (Phi(b)) values of the diode were found to be 2.89 and 0.79 eV, respectively. The device shows photovoltaic behavior with a maximum open-circuit' voltage of 396 mV and a short circuit current of 33.8 mu A under 300W light. (C) 2016 Elsevier Ltd. All rights reserved.
dc.description.sponsorshipRepublic of Turkey-Prime Ministry State Planning organization (DPT) [2010K120610]
dc.description.sponsorshipThis study is supported by Republic of Turkey-Prime Ministry State Planning organization (DPT) (Project Number: 2010K120610, Batman University Central Research Laboratory).
dc.identifier.doi10.1016/j.materresbull.2016.01.021
dc.identifier.endpage121
dc.identifier.issn0025-5408
dc.identifier.issn1873-4227
dc.identifier.scopus2-s2.0-84955244746
dc.identifier.scopusqualityQ1
dc.identifier.startpage115
dc.identifier.urihttps://doi.org/10.1016/j.materresbull.2016.01.021
dc.identifier.urihttps://hdl.handle.net/20.500.12604/6658
dc.identifier.volume77
dc.identifier.wosWOS:000374360700017
dc.identifier.wosqualityQ2
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherPergamon-Elsevier Science Ltd
dc.relation.ispartofMaterials Research Bulletin
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_20241222
dc.subjectElectronic materials
dc.subjectOrganic compounds
dc.subjectSol-gel chemistry
dc.subjectElectron microscopy
dc.subjectElectrical properties
dc.subjectElectronic structure
dc.titleThe optical characterization of organometallic complex thin films by spectroscopic ellipsometry and photovoltaic diode application
dc.typeArticle

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